XSPEX SOFTWARE
I. GENERAL DESCRIPTION
Diano introduces a unique programming approach to X-Ray analysis software "Object Oriented" functionality. This approach combines a preprogrammed set of full range analytical X-Ray functions, with the ability to be readily customized for one or more individual users, projects and special applications.
"Object Oriented" is the newest concept in software design and incorporates a graphical user interface with a functional application approach The concept of "Object-Oriented" means that from the user's perspective, XSPEX software treats
- The Diffractometer
- The Spectrometer
- Samples
- Standards
- Analytical Processes
- Data (readings, peaks, scans, analyses, reports)
all as "intelligent objects" which:
- the user can manipulate in a natural way (e.g., you can pass an entire scan as a single entity to an analytical process which will determine its peaks);
- can respond to commands and queries (e.g., you can "tell" an instrument to configure itself to preset specifications; you can "ask" a sample for a report of its composition, etc.);
- can manipulate each other to achieve complex actions (e.g., a sample can configure and operate an instrument to perform its own self-analysis).
The result is analysis software which is easy-to-use, flexible, with full graphics supported qualitative and quantitative analysis capability.
II. DIFFRACTION FEATURES
GRAPHICS
- Graphically Oriented.
- Up to 6 Entries per Graph Window.
- Up to 6 Graph Entries presented in Projected Mode.
- Linear, Log, Square Root Scaling active on any graph.
- Auto Scaling of Scan Data.
- Window Zoom Capability.
- Complete display can be printed or stored in
computer Metafile format for computer generated slides.
- Text String Input for Graph Information.
QUALITATIVE
- Real-time data display, graphical representation of scan data is presented during
measurement.
- Raw Data Smoothing.
- Background Corrections.
- Deconvolution.
- Peak Search & Labeling.
- Peak Stripping.
- Curve Fitting; Cauchy, or Gaussian, etc.
QUANTITATIVE
- Retained Austenite.
- Residual Stress.
- Integrated Peak Intensity.
- Standards Calibration.
- Bath Ratio Analysis.
- Regression Analysis for Unknown Concentration.
ICDD SEARCH-MATCH (Optional)
- Searches PDF-1, PDF-2 or customer entered Database.
- Database can be segmented for higher efficiency.
- Utilizes 4 Step Matching procedure;
- Quick Search of selected database, using 1 to 8 intensity peaks, (usually 4 highest).
- Elemental Chemistry Restraints Search, either a positive or negative restraint can be used.
- Complete line pattern Search.
- Graphic Display comparison.
III. FLUORESCENCE FEATURES
GRAPHICS
- Graphically Oriented.
- Up to 6 Entries per Graph Window.
- Up to 6 Graph Entries presented in Projected Mode.
- Linear, Log, Square Root Scaling active on any graph.
- Auto Scaling of Scan Data.
- Window Zoom capability.
- Complete display can be printed, or stored in
computer Metafile format for computer generated slides.
- Text String Input for Graph Information.
QUALITATIVE
- Real-time data display, graphical representation of scan data is presented during
measurement.
- Raw Data smoothing.
- Background Corrections.
- Deconvolution.
- Peak Search & Labeling.
- Peak Stripping.
- Curve Fitting; Cauchy, or Gaussian, etc.
QUANTITATIVE
- Bogue Equations.
- Interelement Matrix Corrections.
- Integrated Peak Intensity.
- Standards Calibration.
- Multilinear Regression Analysis.
ELEMENTAL SEARCH/MATCH (Optional)
- Semi-automatic multi-element search utilizing Diano element database.
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